NuCAD Research Laboratory
Headed by Hai Zhou
The VLSI design productivity crisis, that is, the fact that the number of available transistors grows much faster than the ability to design them meaningfully, has become the greatest threat to the growth of semiconductor industry.
Silicon complexity, which refers to the impact of previously ignorable physical phenomena, is at the center of this crisis. Based on our beliefs that the only effective way to improve productivity is to maintain design complexity at a manageable level, and that formal methods are the right techniques for complexity control, the objective of this research is to improve design productivity by applying formal methods to silicon complexity problems such as inductive/capacitive couplings and process variability.